Mapping TDL to TTCN-3

Philip Makedonski, Gusztav Adamis, Martti Käärik, Finn Kristoffersen, György Réthy

Abstract

This presentation will showcase the currently ongoing work on the standardised mapping of TDL to TTCN-3, which is expected to be finished in January 2018. STF 522 will report on the current state of the mapping, the challenges faced during the mapping of the two languages, and corresponding solutions to common problems of bridging the gaps between languages and representations at different levels of abstraction which may benefit users and tool vendors aiming to do the same with other technologies. The presentation will also feature examples from a case study related to smartphone app user interface testing. The presentation will report on the experiences and challenges with mapping both languages, including identifying semantic gaps between the languages, as well as other challenges and common pitfalls, and lessons learnt from the experience, as well as suggestions for the design of future languages at different levels of abstraction.
Keywords: 
ttcn-3, tdl, mbt, test generation, mapping
Document Type: 
Presentations
Howpublished: 
User Conference on Advanced Automated Testing (UCAAT) 2017
Month: 
10
Year: 
2017

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